Exam text content

ELE-4250 Elektroniikan miniatyrisointi - 22.05.2007

Exam text content

The text is generated with Optical Image Recognition from the original exam file and it can therefore contain erroneus or incomplete information. For example, mathematical symbols cannot be rendered correctly. The text is mainly used for generating search results.

Original exam
TAMPEREEN TEKNILLINEN YLIOPISTO

Elektroniikan laitos
Pauliina Mansikkamäki

ELE-4250 ELEKTRONIIKAN MINIATYRISOINTI
TENTTI 22.5.2007

1. Miniatyrisoidun elektroniikan luotettavuuskysymykset (6p)

2. Flip Chip tekniikan hyödyt ja haasteet (6p)

3. Modulaarisuuden hyödyt ja haasteet (6p)

4. Millä kriteereillä arvioisit painettavan teknologian hyötyjä elektroniikan miniatyrisoinnissa? (6p)

5. Mitä asioita tulee ottaa huomioon olemassa olevan tuotteen miniatyrisoinnissa? (6p)


We use cookies

This website uses cookies, including third-party cookies, only for necessary purposes such as saving settings on the user's device, keeping track of user sessions and for providing the services included on the website. This website also collects other data, such as the IP address of the user and the type of web browser used. This information is collected to ensure the operation and security of the website. The collected information can also be used by third parties to enable the ordinary operation of the website.

FI / EN